By Robert L. Snyder (auth.), Camden R. Hubbard, Charles S. Barrett, Paul K. Predecki, Donald E. Leyden (eds.)
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It truly is more often than not impossible to provide technical items having accurately predefined measures. Systematic and random deviations from nominal dimension can't be shunned, and it's for that reason essential to outline dimension tolerances. This booklet bargains a finished presentation of tolerance difficulties and their answer through statistical equipment.
Those volumes comprise the complaints of the workshop at the Institute for laptop Instability and Transition, backed through functions in technological know-how and Engineering (ICASE) and the Langley learn heart (LaRC), in the course of could 15 to June nine, 1989. The paintings store coincided with the initiation of a brand new, concentrated learn professional gram on instability and transition at LaRC.
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Additional info for Advances in X-Ray Analysis: Volume 26
This paper describes a preliminary study of a number of factors that contribute to the accuracy of the intensities. Accurate intensity data are required in a number of applications such as quantitative phase analysis, crystal structure refinement, line profile determination and similar studies. The introduction of the counter tube diffractometer 35 years ago greatly improved the accuracy over film methods but it remains surprisingly difficult to make accurate measurements even now. Much of the problem resides in the specimen preparation which is a dominant factor limiting the accuracy.
PARRISH AND T. C. HUANG Table 1. J. 3 lines to the right of each recording are the averages of the intensities at all azimuths with fast (60 rpm) rotation. The small wiggles result only from counting statistics. The numbers are the chart amplitudes and scaling to the highest= 100, the (111) relative peak intensities were <5 I'm=95, 5-10=100, 10-20=94, 20-30=88 and >30=59. The decrease is probably due mainly to increasing interparticle microabsorption, and the lower particle packing density of the specimen surface.
E. Beu and D. R. Whitney, "Further Developments in the Likelihood Ratio Method for the Precise and Accurate Determination of Lattice Parameters", AEC Research and Development Report, GAT-T-1289/Rev 1 (1965). G. S. Smith and R. L. ,Appl. Cryst. 12 60 (1979). R. Jenkins and F. R. Paolini, "An Automatic Divergence Slit for the Powder Diffractometer", Norelco Reporter 21 9 (1974) . A. M. Bystrom-Asklund, "Sample Cups and a Technique for Sideward Packing of X-ray Diffractometer Specimens", Am. Mineral 51 1233 (1966).
Advances in X-Ray Analysis: Volume 26 by Robert L. Snyder (auth.), Camden R. Hubbard, Charles S. Barrett, Paul K. Predecki, Donald E. Leyden (eds.)