Download e-book for iPad: Advances in X-Ray Analysis: Volume 26 by Robert L. Snyder (auth.), Camden R. Hubbard, Charles S.

By Robert L. Snyder (auth.), Camden R. Hubbard, Charles S. Barrett, Paul K. Predecki, Donald E. Leyden (eds.)

ISBN-10: 1461337275

ISBN-13: 9781461337270

ISBN-10: 1461337291

ISBN-13: 9781461337294

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This paper describes a preliminary study of a number of factors that contribute to the accuracy of the intensities. Accurate intensity data are required in a number of applications such as quantitative phase analysis, crystal structure refinement, line profile determination and similar studies. The introduction of the counter tube diffractometer 35 years ago greatly improved the accuracy over film methods but it remains surprisingly difficult to make accurate measurements even now. Much of the problem resides in the specimen preparation which is a dominant factor limiting the accuracy.

PARRISH AND T. C. HUANG Table 1. J. 3 lines to the right of each recording are the averages of the intensities at all azimuths with fast (60 rpm) rotation. The small wiggles result only from counting statistics. The numbers are the chart amplitudes and scaling to the highest= 100, the (111) relative peak intensities were <5 I'm=95, 5-10=100, 10-20=94, 20-30=88 and >30=59. The decrease is probably due mainly to increasing interparticle microabsorption, and the lower particle packing density of the specimen surface.

E. Beu and D. R. Whitney, "Further Developments in the Likelihood Ratio Method for the Precise and Accurate Determination of Lattice Parameters", AEC Research and Development Report, GAT-T-1289/Rev 1 (1965). G. S. Smith and R. L. ,Appl. Cryst. 12 60 (1979). R. Jenkins and F. R. Paolini, "An Automatic Divergence Slit for the Powder Diffractometer", Norelco Reporter 21 9 (1974) . A. M. Bystrom-Asklund, "Sample Cups and a Technique for Sideward Packing of X-ray Diffractometer Specimens", Am. Mineral 51 1233 (1966).

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Advances in X-Ray Analysis: Volume 26 by Robert L. Snyder (auth.), Camden R. Hubbard, Charles S. Barrett, Paul K. Predecki, Donald E. Leyden (eds.)

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